Bulk-sensitive magnetic microscope utilizing x-ray magnetic circularly polarized emission-Reference-Cited by-同舟云学术

Bulk-sensitive magnetic microscope utilizing x-ray magnetic circularly polarized emission

Published:2021-09-21 Issue:11 Volume:130 Page:113901
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Sugawara Kento¹^ORCID,Inami Toshiya¹^ORCID,Nakada Takahiro²,Sakaguchi Yui³,Takahashi Shin³

Affiliation:

1. Synchrotron Radiation Research Center, National Institutes for Quantum and Radiological Science and Technology, 1-1-1 Koto, Sayo, Hyogo 679-5148, Japan

2. Kurashiki Material Performance Evaluation Center, West Japan Solution Division, JFE Techno-Research Corporation, Kurashiki, Okayama 712-8074, Japan

3. Nano-scale Characterization Center, Functional Materials Solution Division, JFE Techno-Research Corporation, Chiba 260-0835, Japan

Funder

Japan Society for the Promotion of Science

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0058201

Reference27 articles.

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2. R. J. Celotta, J. Unguris, M. H. Kelley, and D. T. Pierce, “Techniques to measure magnetic domain structure,” in Characterization of Materials, edited by E. N. Kaufmann, 2nd ed. (Wiley, Hoboken, NJ, 2012), Vol. 1, pp. 766–780.

3. Equilibrium magnetic states in individual hemispherical permalloy caps

4. Retrieving spin textures on curved magnetic thin films with full-field soft X-ray microscopies

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