Effect of nozzle contamination on microwave discharge cathode performance

Abstract

An understanding of the degradation mechanism of a microwave discharge cathode is the key to extending the lifetime of microwave ion thruster systems. This study investigates the effect of nozzle contamination by sputtered Ag-polytetrafluoroethylene (PTFE) on microwave discharge cathode performance. The current–voltage characteristics were measured for nominal and contaminated (by PTFE spray with 0.2 µm thick or tape with 0.15 mm thick) cathodes. The contamination thickness and area on the nozzle were varied to investigate the characteristic differences. It was confirmed that the anode voltage increased by 20 V or more in the case of the contaminated cathode. The anode voltage was measured for the sputter-contaminated cathode to evaluate the effect of contamination under more realistic conditions. After 630 h of sputter-contamination operation, it is estimated that sputtered particles were deposited to a thickness of 77 µm at most, and the anode voltage increased by 8 V. The results show that the downstream surface of the nozzle is critical for maintaining cathode performance. The insulating coating formed by the sputtered PTFE may interfere with ion absorption and degrade electron emission capability. A theoretical model based on the extended Brophy model supports these results. This study provides important information for the use of PTFE-based materials around ion thrusters.