Low-T anneal as cure for LeTID in Mc-Si PERC cells
Author:
Publisher
AIP Publishing
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5123900
Reference18 articles.
1. Engineering Solutions and Root-Cause Analysis for Light-Induced Degradation in p-Type Multicrystalline Silicon PERC Modules
2. Rapid Stabilization of High-Performance Multicrystalline P-type Silicon PERC Cells
3. Evidence of an identical firing-activated carrier-induced defect in monocrystalline and multicrystalline silicon
4. Firing temperature profile impact on light induced degradation in multicrystalline silicon
5. A four-state kinetic model for the carrier-induced degradation in multicrystalline silicon: Introducing the reservoir state
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1. Research progress of light and elevated temperature-induced degradation in silicon solar cells: A review;Journal of Alloys and Compounds;2022-08
2. Progress in the understanding of light‐ and elevated temperature‐induced degradation in silicon solar cells: A review;Progress in Photovoltaics: Research and Applications;2020-11-17
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