Mechanical stress induced voltage shift in polycrystalline Bi3.25La0.75Ti3O12 thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3247344
Reference20 articles.
1. The Physics of Ferroelectric Memories
2. Ferroelectric Memories
3. Memories are made of …
4. Ferroelectric Bi 3.25 La 0.75 Ti 3 O 12 Films of Uniform a -Axis Orientation on Silicon Substrates
5. Voltage shift of hysteresis loops of SrBi 2 Ta 2 O 9 thin films under unipolar stress
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Thermally activated polarization dynamics under the effects of lattice mismatch strain and external stress in ferroelectric film;Journal of Applied Physics;2012-07
2. Effects of ultraviolet irradiation and soak time on the leakage current of Bi3.25La0.75Ti3O12 thin films;physica status solidi (c);2011-08-03
3. Annealing Temperature Effect on Internal Strain and Ferroelectric Properties of Bi3.25La0.75Ti3O12Thin Films;Ferroelectrics;2010-09-21
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