Kelvin probe force microscopy on InAs thin films grown on GaAs giant step structures formed on (110) GaAs vicinal substrates
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1348318
Reference10 articles.
1. Kelvin probe force microscopy
2. Cross-Sectional Potential Imaging of Compound Semiconductor Heterostructure by Kelvin Probe Force Microscopy
3. Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy
4. Schottky barrier height of n‐InxGa1−xAs diodes
5. Oxidation of InAs(110) and correlated changes of electronic surface properties
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