Impedance spectroscopy of Al/AlN/n-Si metal-insulator-semiconductor (MIS) structures-Reference-Cited by-同舟云学术

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Impedance spectroscopy of Al/AlN/n-Si metal-insulator-semiconductor (MIS) structures

Published:2019-02-28 Issue:8 Volume:125 Page:084501
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Schmidt Rainer¹^ORCID,Mayrhofer Patrick²,Schmid Ulrich²,Bittner Achim³

Affiliation:

1. Department of Materials Physics, GFMC, Universidad Complutense de Madrid, Fac. CC. Físicas, 28040 Madrid, Spain

2. Institute of Sensor and Actuator Systems, TU Wien, Gusshausstrasse 27-29, 1040 Vienna, Austria

3. Hahn-Schickard, Wilhelm-Schickard-Str. 10, 78052 Villingen-Schwenningen, Germany

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5050181

Reference51 articles.

1. Characterization of MIS structure coplanar transmission lines for investigation of signal propagation in integrated circuits

2. A. Sakr, W. Dyab, and K. Wu, in 2016 16th Mediterranean Microwave Symposium (MMS) (IEEE, Abu Dhabi, 2016), pp. 1–4.

3. Spin-polarized light-emitting diode using metal/insulator/semiconductor structures

4. Thin‐MIS‐Structure Si Negative‐Resistance Diode

5. High-performance ZnO∕ZnMgO field-effect transistors using a hetero-metal-insulator-semiconductor structure

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1. Transport and dielectric properties of MIS structure with embedded Si QDs (AuPd/SiO2:Si QDs/n-Si) grown by MBE;Physica B: Condensed Matter;2024-07

2. Electrical and dielectric characterization of Ge quantum dots embedded in MIS structure (AuPd/SiO2:Ge QDs/n-Si) grown by MBE;Physica B: Condensed Matter;2024-07

3. Enriched electron donor sites and non-overlapping small polaron tunneling electrical conduction in oxygen-deficient β-Ga2O3 thin film on p-Si (100);Applied Physics A;2024-06-22

4. Electrical and dielectric properties of ferromagnetic GeMn nanocrystals embedded in metal-oxide-semiconductor Schottky diodes (Al/SiO2:GeMn NCs/n-Si) grown by MBE;Vacuum;2024-06

5. Структура и электропроводность тонких пленок нитрида алюминия на кремнии;Кристаллография;2024-02-15

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