Optical characterization of porous silicon by synchrotron radiation reflectance spectra analyses-Reference-Cited by-同舟云学术

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Optical characterization of porous silicon by synchrotron radiation reflectance spectra analyses

Published:1993-11-15 Issue:20 Volume:63 Page:2774-2776
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Koshida Nobuyoshi,Koyama Hideki,Suda Yoshiyuki,Yamamoto Yuko,Araki Minoru,Saito Tadashi,Sato Katsuaki,Sata Noriko,Shin Shik

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.110330

Reference20 articles.

1. Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

2. Efficient Visible Photoluminescence from Porous Silicon

3. Photoluminescence of high porosity and of electrochemically oxidized porous silicon layers

4. Electroluminescence in the visible range during anodic oxidation of porous silicon films

5. Visible electroluminescence from porous silicon

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1. Study of optical properties of porous silicon by DFT, comparison to experimental and effective medium approximation methods;Bulletin of Materials Science;2024-06-14

2. Electroluminescent Devices Based on Junctions of Silicon-Rich Oxide with Indium Doped Zinc Oxide Thin Solid Films;Journal of Nanoelectronics and Optoelectronics;2014-02-01

3. Electroluminescent Devices Based on Junctions of Indium Doped Zinc Oxide and Porous Silicon;Journal of Nanomaterials;2014

4. Transition between direct and indirect band gap in silicon nanocrystals;Physical Review B;2013-06-03

5. Silicon-Based Light Sources;Handbook of Silicon Photonics;2013-04-09

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