Measurement of stacking fault densities in CoCrPt thin film media using grazing incidence x-ray scattering
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.372491
Reference5 articles.
1. The ultra clean sputtering process and high density magnetic recording media
2. Effect of microstructure on media noise of CoCrTa thin film media fabricated under ultra clean sputtering process
3. Effects of ultra-high vacuum on crystallographic, recording and magnetic properties of thin film media
4. Effects of stacking faults on magnetic viscosity in thin film magnetic recording media
5. The effect of fcc grains on the magnetic and recording properties of thin film media
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2. 2.1.2.2 Co100–xPt x -based solid solution heterocomposites: Magnetic properties and nanostructure;Nanocrystalline Materials, Part B;2015
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4. Semi-quantitative evaluation of stacking faults in pseudo-hcp thin films by laboratory-scale in-plane x-ray diffraction;Journal of Physics D: Applied Physics;2009-06-29
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