Effect of Sample Thickness and Operating Voltage on the Contrast of Kossel Transmission Photographs-Reference-Cited by-同舟云学术

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Effect of Sample Thickness and Operating Voltage on the Contrast of Kossel Transmission Photographs

Published:1966-11 Issue:12 Volume:37 Page:4455-4458
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Yakowitz H.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1708060

Reference6 articles.

1. Divergent-beam X-ray photography of crystals

2. CXXIII. Some properties of lines on divergent-beam x-ray photographs

3. Kossel Line Studies of Irradiated Nickel Crystals

4. XCII. The reflexion of X-rays from imperfect crystals

5. Evaluation of Kossel Microdiffraction Procedures: The Cubic Case

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Precise determination of crystal lattice parameters;Physics-Uspekhi;2020-09-01

2. X-ray divergent-beam (Kossel) technique: A review;Crystallography Reports;2011-03

3. Geometry, Peak Indexing, and Experimental Techniques;Springer Series in Solid-State Sciences;1984

4. The structure of deformed aluminium and its recrystallization—investigations with transmission Kossel diffraction;Acta Metallurgica;1977-05

5. On the unique solution of Kossel patterns;Physica Status Solidi (a);1976-01-16

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