Direct comparison of low‐energy ion backscattering with Auger electron spectroscopy in the analysis of S adsorbed on Ni
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1655251
Reference7 articles.
1. DETERMINATION OF THE CRYSTALLOGRAPHIC POLARITY OF CdS BY ION SCATTERING
2. Born-Mayer-Type Interatomic Potential for Neutral Ground-State Atoms withZ=2toZ=105
3. Investigation of Surface Topography of Oxygen on Nickel Single Crystals by Helium Ion Backscattering
4. Auger electron spectroscopy
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1. Low Energy Ion Scattering;Springer Series in Surface Sciences;2003
2. Application of low‐energy noble‐gas ion scattering to the quantitative surface compositional analysis of binary alloys and metal oxides;Surface and Interface Analysis;1998-07
3. Surface Defect Characterization in Oxygen-Dosed Nickel Surfaces and in NiO Thin Films by CO Adsorption−Desorption Experiments;The Journal of Physical Chemistry B;1997-10-01
4. Extreme surface sensitivity in neon–ion scattering from silicon at ejection energies below 80 eV: Evidence for the presence of oxygen on ion bombarded SiO2;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1997-09
5. An XPD and ISS study of the (2 × 2)-(CO + K) coadsorption structure on Co(0001);Surface Science;1996-02
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