Degradation behavior in the remnant polarization of SrBi2Ta2O9 thin films by hydrogen annealing and its recovery by postannealing
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.124421
Reference7 articles.
1. Electrode‐induced degradation of Pb(ZrxTi1−x)O3 (PZT) polarization hysteresis characteristics in Pt/PZT/Pt ferroelectric thin‐film capacitors
2. H2 damage of ferroelectric Pb(Zr,Ti)O3 thin-film capacitors—The role of catalytic and adsorptive activity of the top electrode
3. Analytical transmission electron microscopy of hydrogen-induced degradation in ferroelectric Pb(Zr, Ti)O3 on a Pt electrode
4. Effect of hydrogen on Pb(Zr,Ti)O3-based ferroelectric capacitors
5. Electrode dependence of hydrogen-induced degradation in ferroelectric Pb(Zr,Ti)O3 and SrBi2Ta2O9 thin films
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1. Analysis of Polarization Characteristics Change of the Si-doped HfO2 with Temperature Using Impedance Spectroscopy;Journal of the Korean Physical Society;2020-11
2. Impact of forming gas annealing on the dielectric properties of SrBi2Ta2O9 thin films prepared by metalorganic decomposition;Journal of Applied Physics;2012-10-15
3. Effect of Forming Gas on Properties of SrBi2Ta2O9 Ferroelectric Thin Film and Powder;Journal of Inorganic Materials;2009-08-13
4. SYNTHESIS AND CHARACTERIZATION OF FERROELECTRIC NANOCRYSTAL POWDERS OF SrBi2Ta2O9 BY A POLYMERIZABLE COMPLEX METHOD;International Journal of Modern Physics B;2005-07-10
5. Hydrogen-Induced Degradation and Passivation of Ferroelectric SrBi2Ta2O9 Thin Films by Au Top Electrode;Materials Science Forum;2004-03
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