Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance-Reference-Cited by-同舟云学术

Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance

Published:2019-03 Issue:3 Volume:90 Page:033707
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Dagdeviren Omur E.¹,Schwarz Udo D.¹²^ORCID

Affiliation:

1. Department of Mechanical Engineering and Materials Science, Yale University, New Haven, Connecticut 06520, USA

2. Department of Chemical and Environmental Engineering, Yale University, New Haven, Connecticut 06520, USA

Funder

National Science Foundation

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5089634

Reference43 articles.

1. Atomic Force Microscope

2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

3. Advances in atomic force microscopy

4. Imaging physical phenomena with local probes: From electrons to photons

5. Atomic Resolution with Atomic Force Microscope

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