Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments-Reference-Cited by-同舟云学术

Development of an X-ray pixel detector with multi-port charge-coupled device for X-ray free-electron laser experiments

Published:2014-03 Issue:3 Volume:85 Page:033110
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Kameshima Takashi,Ono Shun,Kudo Togo,Ozaki Kyosuke,Kirihara Yoichi,Kobayashi Kazuo,Inubushi Yuichi,Yabashi Makina,Horigome Toshio,Holland Andrew,Holland Karen,Burt David,Murao Hajime,Hatsui Takaki

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4867668

Reference45 articles.

1. First lasing and operation of an ångstrom-wavelength free-electron laser

2. A compact X-ray free-electron laser emitting in the sub-ångström region

3. Pixel array detector for X-ray free electron laser experiments

4. The adaptive gain integrating pixel detector AGIPD a detector for the European XFEL

5. Expected performance of the DEPFET sensor with signal compression: A large format X-ray imager with mega-frame readout capability for the European XFEL

Cited by 225 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Real-time observation of a metal complex-driven reaction intermediate using a porous protein crystal and serial femtosecond crystallography;Nature Communications;2024-06-29

2. (Sub-)Picosecond Surface Correlations of Femtosecond Laser Excited Al-Coated Multilayers Observed by Grazing-Incidence X-ray Scattering;Nanomaterials;2024-06-19

3. Sub-photon accuracy noise reduction of a single shot coherent diffraction pattern with an atomic model trained autoencoder;Optics Express;2024-05-02

4. Feature extraction and spatial imaging of synchrotron radiation X-ray diffraction patterns using unsupervised machine learning;Science and Technology of Advanced Materials: Methods;2024-04-15

5. Development of the multiplex imaging chamber at PAL-XFEL;Journal of Synchrotron Radiation;2024-03-22