Improved time‐of‐flight ion charge state diagnostic
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1139405
Reference6 articles.
1. Ion beam pulsing for time of flight (TOF) experiments
2. Time and position‐sensitive detector for dissociative processes in fast beams
3. Time of flight analysis of metastable products from a gas discharge
4. High current ion source
5. The Metal Vapor Vacuum ARC (MEVVA) High Current Ion Source
Cited by 113 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Low-pressure high-current pulsed magnetron discharge with electron injection from a vacuum arc plasma emitter;Vacuum;2024-01
2. Production of Multiply Charged Bismuth Ion Beams in a Vacuum Arc Ion Source with a Submicrosecond Pulse Duration;Russian Physics Journal;2023-02
3. Modified residual gas analyzer for measuring the ion mass-to-charge composition of a repetitively pulsed plasma;AIP Advances;2022-02-01
4. Development of Time-of-Flight Mass Spectrometer for Detection of High Energy Ion and Its Application in Plasma Diagnosis;CHINESE J ANAL CHEM;2021
5. Generation of a Metal Ion Beam Using a Vacuum Magnetron Discharge;Plasma;2021-04-05
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3