Measurement and analysis of the mean free path governing high-energy electron scattering in CdTe, via off-axis electron holography
Author:
Affiliation:
1. Okinawa Institute of Science and Technology Graduate University, 1919-1 Tancha, Onna-son, Kunigami-gun, Okinawa 904-0495, Japan
Funder
Japan Society for the Promotion of Science
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0036989
Reference46 articles.
1. Performance of a new Schottky CdTe detector for hard x-ray spectroscopy
2. Experimental Results of the Gamma-Ray Imaging Capability With a Si/CdTe Semiconductor Compton Camera
3. Performance of a new Schottky CdTe detector for hard X-ray spectroscopy
4. Investigation of CdTe, GaAs, Se and Si as Sensor Materials for Mammography
5. Hybrid pixel direct detector for electron energy loss spectroscopy
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Electron inelastic mean free path in UO2 and (U, Pu)O2 fuels;Acta Materialia;2023-04
2. Interpretation of mean free path values derived from off-axis electron holography amplitude measurements;Micron;2022-11
3. Publisher’s Note: “Measurement and analysis of the mean free path governing high-energy electron scattering in CdTe, via off-axis electron holography” [J. Appl. Phys. 129, 055109 (2021)];Journal of Applied Physics;2021-07-07
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