Growth, structure, and properties of all-epitaxial ferroelectric (Bi,La)4Ti3O12∕Pb(Zr0.4Ti0.6)O3∕(Bi,La)4Ti3O12 trilayered thin films on SrRuO3-covered SrTiO3(011) substrates-Reference-Cited by-同舟云学术

Growth, structure, and properties of all-epitaxial ferroelectric (Bi,La)4Ti3O12∕Pb(Zr0.4Ti0.6)O3∕(Bi,La)4Ti3O12 trilayered thin films on SrRuO3-covered SrTiO3(011) substrates

Published:2005-02-21 Issue:8 Volume:86 Page:082906
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Bao Dinghua,Lee Sung Kyun,Zhu Xinhua,Alexe Marin,Hesse Dietrich

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1864248

Reference16 articles.

1. Ferroelectric Memories

2. Lanthanum-substituted bismuth titanate for use in non-volatile memories

3. The Physics of Ferroelectric Memories

4. Ferroelectric Bi 3.25 La 0.75 Ti 3 O 12 Films of Uniform a -Axis Orientation on Silicon Substrates

5. Strain manipulation in BaTiO3/SrTiO3 artificial lattice toward high dielectric constant and its nonlinearity

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