X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry-Reference-Cited by-同舟云学术

X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Published:2018-10 Issue:10 Volume:89 Page:10G127
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Valdivia M. P.¹,Veloso F.²,Stutman D.¹,Stoeckl C.³,Mileham C.³,Begishev I. A.³,Theobald W.³,Vescovi M.²,Useche W.²,Regan S. P.³,Albertazzi B.⁴,Rigon G.⁴^ORCID,Mabey P.⁴,Michel T.⁴,Pikuz S. A.⁵,Koenig M.⁴,Casner A.⁶^ORCID

Affiliation:

1. Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218, USA

2. Instituto de Física, Pontificia Universidad Católica de Chile, Casilla 306, Santiago, Chile

3. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623, USA

4. Laboratoire pour l’Utilisation de Lasers Intenses, CNRS CEA, Ecole Polytechnique, 91128 Palaiseau Cedex, France

5. Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow 125412, Russia

6. Université de Bordeaux-CNRS-CEA, CELIA, UMR 5107, F-33405 Talence, France

Funder

U.S. Department of Energy

Fondo Nacional de Desarrollo Científico y Tecnológico

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5039342

Reference31 articles.

1. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources

2. Phase Tomography by X-ray Talbot Interferometry for Biological Imaging

3. Talbot-Lau x-ray interferometry for high energy density plasma diagnostic

4. Talbot-Lau based Moiré deflectometry with non-coherent sources as potential High Energy Density plasma diagnostic

5. Publisher’s Note: “Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)” [Rev. Sci. Instrum. 87, 11D501 (2016)]

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