Insitumeasurements of critical layer thickness and optical studies of InGaAs quantum wells grown on GaAs substrates
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.102279
Reference13 articles.
1. Variation of the critical layer thickness with In content in strained InxGa1−xAs‐GaAs quantum wells grown by molecular beam epitaxy
2. Photoluminescence and photoconductivity measurements on band-edge offsets in strained molecular-beam-epitaxy-grownInxGa1−xAs/GaAs quantum wells
3. Observation of compressive and tensile strains in InGaAs/GaAs by photoluminescence spectroscopy
4. Optical characterization of pseudomorphic InxGa1−xAs–GaAs single‐quantum‐well heterostructures
5. Critical layer thickness in In0.2Ga0.8As/GaAs single strained quantum well structures
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