Author:
Giridharagopal Rajiv,Zhang Jun,Kelly Kevin F.
Funder
National Science Foundation
Reference16 articles.
1. Mesoscopic Work Function Measurement by Scanning Tunneling Microscopy
2. Semiconductor characterization with the scanning surface harmonic microscope
3. K. F. Kelly, Z. J. Donhauser, B. A. Mantooth, and P. S. Weiss, in NATO ASI Series II: Mathematics, Physics, and Chemistry, edited by P. Vilarinho, Y. Rosenwaks, and A. Kingon (Kluwer Academic, Norwell, MA, USA, 2005), Vol. 186, p. 153.
4. EXTENSIONS OF STM
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