A model to non-uniform Ni Schottky contact on SiC annealed at elevated temperatures

Author:

Pristavu G.1,Brezeanu G.1,Badila M.1,Pascu R.12,Danila M.2,Godignon P.3

Affiliation:

1. Electronics, Telecommunications and Information Technology, University Politehnica Bucharest, Bucharest 061071, Romania

2. National Institute for Research and Development in Microtechnologies, Erou Iancu Nicolae Street 126A, 077190 Bucharest, Romania

3. Centro Nacional de Microelectronica, C/del Til·lers. Campus Universitat Autònoma de Barcelona, 08193 Barcelona, Spain

Funder

PNII National Romanian Project

Sectoral Operational Programme Human Resources Development 2007-2013

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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1. Enhanced Method of Schottky Barrier Diodes Performance Assessment;Romanian Journal of Information Science and Technology;2023-03-27

2. Schottky diode on Silicon Carbide (SiC): ideal detector for very wide temperature range sensors;Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies XI;2023-03-02

3. Electrical, morphological and structural properties of Ti ohmic contacts formed on n-type 4H–SiC by laser thermal annealing;Materials Science in Semiconductor Processing;2022-11

4. The effect of forming gas annealing on Al/Ti/n-Si contacts;2022 International Semiconductor Conference (CAS);2022-10-12

5. Improving the barrier inhomogeneity of 4H-SiC Schottky diodes by inserting Al2O3 interface layer;Solid-State Electronics;2021-06

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