Potential shielding by the surface water layer in Kelvin probe force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1455145
Reference14 articles.
1. Status and review of two-dimensional carrier and dopant profiling using scanning probe microscopy
2. Application of scanning capacitance microscopy to semiconductor devices
3. Kelvin probe force microscopy
4. Scanning maxwell stress microscope for nanometre-scale surface electrostatic imaging of thin films
5. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
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