Separation of optical thin‐film and substrate absorption by means of photothermal surface deformation technique
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.345140
Reference9 articles.
1. Measurement of the thickness dependence of absorption in HfO2 and ZnS single-layer films
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4. Measurement of optical losses and damage resistance of ZnSNa3AlF6 and TiO2SiO2 laser mirrors depending on coating design
5. Correlation between morphology, optical losses and laser damage of MgF2−SiO2 multilayers
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1. Measurement of the thermal coefficients of rewritable phase-change optical recording media;Applied Optics;2002-01-10
2. Measurement of the thermal conductivity of erasable phase-change optical recording media;Applied Optics;2000-05-10
3. Applications of photothermal displacement spectroscopy to the study of asphaltenes adsorption;Optics Communications;1998-01
4. Front and back illumination of coated substrates for in-depth localization of absorption;Optical Engineering;1997-04-01
5. Photothermal characterization of optical thin film coatings;Optical Engineering;1997-01-01
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