Correlation between microstructure, electronic properties and flicker noise in organic thin film transistors-Reference-Cited by-同舟云学术

Correlation between microstructure, electronic properties and flicker noise in organic thin film transistors

Published:2008-03-31 Issue:13 Volume:92 Page:132103
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Jurchescu Oana D.,Hamadani Behrang H.,Xiong Hao D.,Park Sungkyu K.,Subramanian Sankar,Zimmerman Neil M.,Anthony John E.,Jackson Thomas N.,Gundlach David J.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2903508

Reference10 articles.

1. Colloquium: Electronic transport in single-crystal organic transistors

2. Charge-Transport Regime of Crystalline Organic Semiconductors: Diffusion Limited by Thermal Off-Diagonal Electronic Disorder

3. Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits

4. 1/f noise in pentacene organic thin film transistors

5. Flicker noise properties of organic thin-film transistors

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