Data-driven assessment of chemical vapor deposition grown MoS2 monolayer thin films-Reference-Cited by-同舟云学术

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Data-driven assessment of chemical vapor deposition grown MoS2 monolayer thin films

Published:2020-12-21 Issue:23 Volume:128 Page:235303
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Costine Anna¹,Delsa Paige²,Li Tianxi³,Reinke Petra¹^ORCID,Balachandran Prasanna V.¹⁴^ORCID

Affiliation:

1. Department of Materials Science and Engineering, University of Virginia, Charlottesville, Virginia 22904, USA

2. Louisiana School for Math, Science, and the Arts, Natchitoches, Louisiana 71457, USA

3. Department of Statistics, University of Virginia, Charlottesville, Virginia 22904, USA

4. Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, Virginia 22904, USA

Funder

National Science Foundation

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/5.0017507

Reference86 articles.

1. Measurement of mobility in dual-gated MoS2 transistors

2. Ambipolar Light-Emitting Transistors on Chemical Vapor Deposited Monolayer MoS2

3. Single-layer MoS2 transistors

4. High mobility top gated field-effect transistors and integrated circuits based on chemical vapor deposition-derived monolayer MoS₂

5. A roadmap for electronic grade 2D materials

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2. Quantum and classical machine learning investigation of synthesis–structure relationships in epitaxially grown wide band gap semiconductors;MRS Communications;2024-07-09

3. Recent Progress in Heat and Mass Transfer Modeling for Chemical Vapor Deposition Processes;Energies;2024-07-03

4. Boosting computational thermodynamic analysis of the CVD of SiC coating via machine learning;Journal of Crystal Growth;2024-07

5. Designing semiconductor materials and devices in the post-Moore era by tackling computational challenges with data-driven strategies;Nature Computational Science;2024-05-23

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