ELECTRON BOMBARDMENT OF MOS CAPACITORS
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1754525
Reference7 articles.
1. THE EFFECT OF LOW‐ENERGY ELECTRON IRRADIATION OF METAL‐OXIDE‐SEMICONDUCTOR STRUCTURES
2. Effects of electron irradiation on metal-oxide semiconductor transistors
3. EFFECTS OF LOW‐ENERGY ELECTRON IRRADIATION ON Si‐INSULATED GATE FETs
4. Field Effect-Capacitance Analysis of Surface States on Silicon
5. Limitations of the MOS capacitance method for the determination of semiconductor surface properties
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