Thickness and density determination of ultrathin solid films comprising multilayer x‐ray mirrors by x‐ray reflection and fluorescence study
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143010
Reference15 articles.
1. The renaissance of x‐ray optics
2. Characterization of X-UV multilayers by grazing incidence X-ray reflectometry
3. Characterization of multilayer coatings by X-ray reflection
4. Density Measurements of Some Thin Copper Films
5. X‐Ray Reflection Studies of the Anneal and Oxidation of Some Thin Solid Films
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2. Multilayer optics for XUV spectral region: technology fabrication and applications;Open Physics;2003-01-01
3. Determination of the parameters of a rough surface from the dynamical X-ray diffraction data;Crystallography Reports;2002-11
4. Theory and applications of x-ray standing waves in real crystals;Reports on Progress in Physics;2001-08-22
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