Noise-based analysis of the reliability of silicon solar cells
Author:
Affiliation:
1. Department of Electronic and Information Engineering, Ankang University, AnKang 725000, China
2. Advanced Materials and Nano Technology School, Xidian University, Xi an 710071, China
Funder
National Natural Science Foundation of China
Outstanding Young Talents Project in Shaanxi Province
The Scientific Research Fund of Shaanxi Provincial Education Department
The Science and Technology in Ankang Project
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0045349
Reference22 articles.
1. NOISE AND SCANNING BY LOCAL ILLUMINATION AS RELIABILITY ESTIMATION FOR SILICON SOLAR CELLS
2. Noise as a tool for non-destructive testing of single-crystal silicon solar cells
3. 1/fnoise and dye-sensitized solar cells
4. 1/f Noise in dye-sensitized solar cells and NIR photon detectors
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