Electromigration-induced grain rotation in anisotropic conducting beta tin
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1941456
Reference14 articles.
1. Electromigration induced resistance decrease in Sn conductors
2. Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction
3. Possibility of Subgrain Rotation during Recrystallization
4. Investigation of low energy grain boundaries in metals by a sintering technique
5. Scaling Behavior of Grain-Rotation-Induced Grain Growth
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