Abnormal threshold voltage shifts in p-channel low temperature polycrystalline silicon TFTs under deep UV irradiation-Reference-Cited by-同舟云学术

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Abnormal threshold voltage shifts in p-channel low temperature polycrystalline silicon TFTs under deep UV irradiation

Published:2021-08-01 Issue:8 Volume:11 Page:085328
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Cheng Hong¹²^ORCID,Lin Xinnan¹

Affiliation:

1. School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, University Town, Nanshan District, Shenzhen 518055, People’s Republic of China

2. Array Technology Development Department, TCL China Star Optoelectronics Technology Co., Ltd., 9-2 Tangming Avenue, Shenzhen 518055, People’s Republic of China

Funder

Shenzhen Science and Technology Project

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0060553

Reference32 articles.

1. The new route for realization of 1‐μm‐pixel‐pitch high‐resolution displays

2. 41‐1: Invited Paper: Active Matrix Mini‐LED Backlights for 1000PPI VR LCD

3. Fine metal mask material and manufacturing process for high‐resolution active‐matrix organic light‐emitting diode displays

4. 15‐4: New Gen. 6 Exposure Tools for 1.2 μm Resolution

5. High-resolution technology for FPD manufacturing

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1. Thin-film electronics on active substrates: review of materials, technologies and applications;Journal of Physics D: Applied Physics;2022-05-31

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