Direct high-resolution ion beam-profile imaging using a position-sensitive Faraday cup array-Reference-Cited by-同舟云学术

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Direct high-resolution ion beam-profile imaging using a position-sensitive Faraday cup array

Published:2009-11 Issue:11 Volume:80 Page:113302
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Panitzsch Lauri,Stalder Michael,Wimmer-Schweingruber Robert F.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3246787

Reference8 articles.

1. Beam Instrumentation Workshop 2008;Todd D. S.,2008

2. 17th Workshop on ECR Ion Sources and their Applications, ECRIS 06;Spädtke P.,2007

3. Simple profile monitor for low intensity, low‐duty cycle pulse ion beams

4. Ion Beam Induced Luminescence of Alkali Halide Crystals

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