Using NIST crystal data within Siemens software for four-circle and SMART CCD diffractometers-Reference-Cited by-同舟云学术

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Using NIST crystal data within Siemens software for four-circle and SMART CCD diffractometers

Published:1996-05 Issue:3 Volume:101 Page:295
ISSN:1044-677X
Container-title:Journal of Research of the National Institute of Standards and Technology
language:
Short-container-title:J. Res. Natl. Inst. Stand. Technol.

Author:

Byram S.K.,Campana C.F.,Fait J.,Sparks R.A.

Publisher

National Institute of Standards and Technology (NIST)

Subject

General Engineering

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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