Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NdBa2Cu3O7-δ Thin Film
Author:
Affiliation:
1. National Institute for Materials Science
2. Present Affiliation: Sony Chemical & Information Device Corporation
Publisher
The Materials Research Society of Japan
Link
https://www.jstage.jst.go.jp/article/tmrsj/35/1/35_195/_pdf
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Characterization of Superconducting Thin Films by Scanning SQUID Microscopy;IEEJ Transactions on Sensors and Micromachines;2013
2. Alternative Materials Development Utilizing Advanced Nanotechnology;Handbook of Sustainable Engineering;2013
3. Direct Observation of Local Shielding Currents in Superconducting Thin Films under Low Magnetic Field by Scanning Superconducting Quantum Interference Device Microscopy;Japanese Journal of Applied Physics;2012-09-01
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