Comparison of Models and Whole‐Genome Profiling Approaches for Genomic‐Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat-Reference-Cited by-同舟云学术

Comparison of Models and Whole‐Genome Profiling Approaches for Genomic‐Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat

Published:2017-07 Issue:2 Volume:10 Page:
ISSN:1940-3372
Container-title:The Plant Genome
language:en
Short-container-title:Plant Genome

Author:

Juliana Philomin¹,Singh Ravi P.²,Singh Pawan K.²,Crossa Jose²,Rutkoski Jessica E.¹²,Poland Jesse A.³,Bergstrom Gary C.⁴,Sorrells Mark E.¹

Affiliation:

1. Plant Breeding and Genetics SectionSchool of Integrative Plant ScienceCornell Univ.IthacaNY14853

2. International Maize and Wheat Improvement Center (CIMMYT)Apdo, Postal 6‐64106600MexicoD.F.Mexico

3. Wheat Genetics Resource Center, Dep. of Plant Pathology and Dep. of AgronomyKansas State Univ.ManhattanKS66506

4. Plant Pathology and Plant‐Microbe Biology SectionSchool of Integrative Plant ScienceCornell Univ.IthacaNY14853

Publisher

Wiley

Subject

Plant Science,Agronomy and Crop Science,Genetics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.3835/plantgenome2016.08.0082

Reference100 articles.

1. Accuracy and Training Population Design for Genomic Selection on Quantitative Traits in Elite North American Oats

2. Genomewide Selection when Major Genes Are Known

3. Prospects for Genomewide Selection for Quantitative Traits in Maize

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