Five New Hot Jupiter Transits Investigated with Swift-UVOT

Author:

Corrales LiaORCID,Ravi SasikrishnaORCID,King George W.ORCID,May ErinORCID,Rauscher EmilyORCID,Reynolds MarkORCID

Abstract

Abstract Short-wavelength exoplanet transit measurements have been used to probe mass loss in exoplanet atmospheres. We present the Swift-UVOT transit light curves for five hot Jupiters orbiting UV-bright F-type stars: XO-3, KELT-3, WASP-3, WASP-62, and HAT-P-6. We report one positive transit detection of XO-3b and one marginal detection of KELT-3b. We place upper limits on the remaining three transit depths. The planetary radii derived from the NUV transit depths of both potential detections are 50%–100% larger than their optical radius measurements. We examine the ratio R NUV/R opt for trends as a function of estimated mass-loss rate, which we derive from X-ray luminosity obtained from the Swift-XRT or, in the case of WASP-62, XMM-Newton. We find no correlation between the energy-limited photoevaporative mass-loss rate and the R NUV/R opt ratio. We also search for trends based on the equilibrium temperature of the hot Jupiters. We find a possible indication of a transition in the R NUV/R opt ratio around T eq = 1700 K, analogous to the trends found for NIR water features in transmission spectra. This might be explained by the formation of extended cloud decks with silicate particles ≤1 μm. We demonstrate that the Swift-UVOT filters could be sensitive to absorption from aerosols in exoplanet atmospheres.

Publisher

American Astronomical Society

Subject

Space and Planetary Science,Astronomy and Astrophysics

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3