Sensitivity Based Statistical Analysis of Circuit Parameters Obtained From a Quasi-Tem Analysis of Multiconductor Transmission Lines-Reference-Cited by-同舟云学术

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Sensitivity Based Statistical Analysis of Circuit Parameters Obtained From a Quasi-Tem Analysis of Multiconductor Transmission Lines

Published:1997-01 Issue:11 Volume:11 Page:1483-1508
ISSN:0920-5071
Container-title:Journal of Electromagnetic Waves and Applications
language:en
Short-container-title:Journal of Electromagnetic Waves and Applications

Author:

Laermans E.¹,Olyslager F.²,Zutter D.³

Affiliation:

1. a Department of Information Technology (INTEC) University of Gent Sint-Pietersnieuwstraat 41 B-9000 Gent, Belgium

2. b Department of Information Technology (INTEC) University of Gent Sint-Pietersnieuwstraat 41 B-9000 Gent, Belgium

3. c Department of Information Technology (INTEC) University of Gent Sint-Pietersnieuwstraat 41 B-9000 Gent, Belgium

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,General Physics and Astronomy,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1163/156939397X00558

Reference40 articles.

1. New fast and accurate line parameter calculation of general multiconductor transmission lines in multilayered media

2. Space-domain Green's function approach to the capacitance calculation of multiconductor lines in multilayered dielectrics with improved surface charge modeling

3. Multiconductor Transmission Lines In Multilayered Dielectric Media

4. Losses on Multiconductor Transmission Lines in Multilayered Dielectric Media

5. Quasi-TEM analysis of multilayered, multiconductor coplanar structures with dielectric and magnetic anisotropy including substrate losses

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1. Probabilistic modelling of stochastic interactions between electromagnetic fields and systems;Comptes Rendus Physique;2006-06

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