Global well-posedness of solutions for the epitaxy thin film growth model
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Published:2021-07-01
Issue:4
Volume:26
Page:565-580
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ISSN:2335-8963
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Container-title:Nonlinear Analysis: Modelling and Control
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language:
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Short-container-title:NAMC
Author:
Duan Ning,Liu Fengnan,Zhao Xiaopeng
Abstract
In this paper, we consider the global well-posedness of solutions for the initial-boundary value problems of the epitaxy growth model. We first construct the local smooth solution, then by combining some a priori estimates, continuity argument, the local smooth solutions are extended step by step to all t > 0, provided that the initial datums sufficiently small and the smooth nonlinear functions satisfy certain local growth conditions.
Publisher
Vilnius University Press
Subject
Applied Mathematics,Analysis