Electrical Responses of Modified Mineral Surfaces as Observed With Spectral Induced Polarization and Atomic Force Microscopy

Abstract

AbstractAtomic force microscopy (AFM) and spectral induced polarization (SIP) are widely used to investigate the electrical properties of mineral surfaces at vastly different scales of measurement. We compare AFM and SIP measurements made on two different materials (glass beads and silica gel) subjected to etching, deposition of iron oxide particles, and inclusion of calcite grains. We found that the treatments produced qualitatively consistent behaviors in the AFM and SIP data. Direct AFM measurements of surface charge density for silica and calcite surfaces were quantitatively compared to values estimated from the SIP results using a grain polarization model. No statistically significant difference (at a 95% confidence level) was found between the surface charge density of silica estimated by AFM (2.3 ± 6.6 mC/m2 for glass beads and 1.6 ± 0.1 mC/m2 for silica gel) versus SIP (5.4 ± 4.4 mC/m2 for glass beads and 1.6 ± 0.5 mC/m2 for silica gel). The surface charge density for calcite determined by AFM (43.5 ± 12.9 mC/m2) was approximately 19 times higher than that found for silica. While the charge density of calcite surfaces determined by SIP was also generally higher than that found for silica, different treatments produced significantly different values between 4.7 and 258 mC/m2 (with a maximum 95% CI of ±8.7 mC/m2). Several possible explanations exist for the range of the observed SIP measurements, including aging of the calcite surfaces. Overall, this study suggests the potential for the complementary use of AFM and SIP measurements to constrain future investigations of polarization mechanisms in porous media.