Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

Author:

Fiala Pavel1,Bartušek Karel2,Dědková Jarmila3,Kadlec Radim3,Dohnal Přemysl3

Affiliation:

1. SIX Research Center , Brno University of Technology , Technická 12, 616 00 Brno , Czech Republic

2. Institute of Scientific Instruments of the ASCR v.v.i. , Kralovopolská, 147, Brno , 612 00 , Czech Republic

3. Dept. of Theoretical and Experimental Electrical Engineering , Brno University of Technology , Technická 12, 616 00 Brno , Czech Republic

Abstract

Abstract We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum; the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell’s law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.

Publisher

Walter de Gruyter GmbH

Subject

Instrumentation,Biomedical Engineering,Control and Systems Engineering

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