Pulsed laser annealing technology for nanoscale fabrication of silicon-based devices in semiconductors

Author:

Pey K.L.,Lee P.S.

Publisher

Elsevier

Reference71 articles.

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4. Annealing of ultrashallow p+/n junction by 248nm excimer laser and rapid thermal processing with different preamorphization depths;Chong;Appl. Phys. Lett.,2000

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