X-ray Diffraction Study of Low- and High-Angle Misorientations in LiF Crystals during Creep-Reference-Cited by-同舟云学术

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X-ray Diffraction Study of Low- and High-Angle Misorientations in LiF Crystals during Creep

Published:2005 Issue:10 Volume:47 Page:1872
ISSN:1063-7834
Container-title:Physics of the Solid State
language:en
Short-container-title:Phys. Solid State

Author:

Smirnov B. I.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/1.2087740.pdf

Reference23 articles.

1. D. A. Hughes and N. Hansen, Acta Mater. 48(11), 2985 (2000).

2. I. J. Beyerlein, R. A. Lebensohn, and C. N. Tome, Mater. Sci. Eng., A 345(1–2), 122 (2003).

3. NATO Sci. Ser., Ser. II: Math. Phys. Chem.;A. A. Nazarov,2005

4. S. Takeuchi and A. S. Argon, J. Mater. Sci. 7(11), 1542 (1972).

5. M. M. Myshlyaev, Fiz. Tverd. Tela (Leningrad) 7(2), 571 (1965) [Sov. Phys. Solid State 7 (2), 668 (1965)].

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Plastic Creep Features of Sapphire at Near-Melting Point Temperatures;Crystallography Reports;2019-11

2. Formation of nanodefects in LiF crystals under gamma irradiation;Physics of the Solid State;2006-12

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