Reliability estimate for semiconductor laser module ILPN-134-Reference-Cited by-同舟云学术

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Reliability estimate for semiconductor laser module ILPN-134

Published:2010-03 Issue:3 Volume:44 Page:359-365
ISSN:1063-7826
Container-title:Semiconductors
language:en
Short-container-title:Semiconductors

Author:

Zhuravleva O. V.,Ivanov A. V.,Kurnosov V. D.,Kurnosov K. V.,Romantsevich V. I.,Chernov R. V.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1134/S1063782610030152.pdf

Reference15 articles.

1. S. L. Yellen, A. H. Shepard, R. J. Dalby, et al., IEEE J. Quant. Electron. 29, 2058 (1993).

2. O. Fujita, Y. Nakano, and G. Iwane, IEEE J. Lightwave Technol. 3, 1211 (1985).

3. N. Chand, J. W. Osenbach, T. L. Evanosky, R. B. Comizzoli, and W. T. Tsnag, IEEE. J. Quant. Electron. 32, 1606 (1996).

4. J. W. Osenbach, T. L. Evanosky, N. Chand, R. B. Comizzoli, and H. W. Krautter, IEEE J. Lightwave Technol. 15, 861 (1997).

5. H.-P. Shiao, C.-Y. Wang, T.-T. Shih, and Y.-K. Tu, IEEE Phot. Technol. Lett. 10, 1238 (1998).

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