1. E. R. Brown, Int. J. of High Speed Electron. and Syst. 13, 995 (2003).
2. V. I. Shashkin, A. V. Murel’, Yu. N. Drozdov, et al., Mikroelektronika 26(1), 57 (1997).
3. V. I. Shashkin, Yu. A. Drjagin, V. R. Zakamov, et al., Int. J. Infrared Millimeter Waves 28, 945 (2007).
4. V. R. Zakamov, A. V. Murel’, and V. I. Shashkin, Kontrol’, Diagn., No. 5, 15 (2009).
5. V. R. Zakamov and V. I. Shashkin, in Proc. 10th Europ. Conf. on Non-Destructive Testing, Moscow, Jun. 7–11, 2010 (Publish. House “Spektr”, Moscow, 2010), p. 327.