High-Precision Characterization of Super-Multiperiod AlGaAs/GaAs Superlattices Using X-Ray Reflectometry on a Synchrotron Source-Reference-Cited by-同舟云学术

High-Precision Characterization of Super-Multiperiod AlGaAs/GaAs Superlattices Using X-Ray Reflectometry on a Synchrotron Source

Published:2021-12-20 Issue: Volume: Page:
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Goray L. I.,Pirogov E. V.,Svechnikov M. V.,Sobolev M. S.,Polyakov N. K.,Gerchikov L. G.,Nikitina E. V.,Dashkov A. S.,Borisov M. M.,Yakunin S. N.,Bouravleuv A. D.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

https://link.springer.com/content/pdf/10.1134/S1063785021080071.pdf

Reference23 articles.

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4. L. I. Goray, E. V. Pirogov, E. V. Nikitina, E. V. Ubyivovk, L. G. Gerchikov, A. N. Ipatov, A. S. Dashkov, M. S. Sobolev, I. V. Ilkiv, and A. D. Bouravlev, Semiconductors 53, 1914 (2019). https://doi.org/10.1134/S1063782619140094

5. A. A. Andronov, E. P. Dodin, D. I. Zinchenko, Yu. N. Nozdrin, A. A. Marmalyuk, and A. A. Padalitsa, Quantum Electron. 40, 400 (2010). https://doi.org/10.1070/QE2010v040n05ABEH014298

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