Johann crystal diffraction spectrometer for measuring small chemical shifts of soft X-ray lines-Reference-Cited by-同舟云学术

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Johann crystal diffraction spectrometer for measuring small chemical shifts of soft X-ray lines

Published:2009-01 Issue:1 Volume:35 Page:73-75
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Petrunin A. A.,Sovestnov A. E.,Tyunis A. V.,Fomin É. V.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063785009010222.pdf

Reference5 articles.

1. O. I. Sumbaev and A. F. Mezentsev, Zh. Éksp. Teor. Fiz. 48, 445 (1965) [Sov. Phys. JETP 21, 295 (1965)].

2. O. I. Sumbaev, Usp. Fiz. Nauk 124, 281 (1978) [Sov. Phys. Usp. 21, 141 (1978).

3. A. V. Tyunis, Candidate’s Dissertation in Physics and Mathematics (St. Petersburg, 1996).

4. H. H. Johann, Z. Phys. 69, 185 (1031).

5. V. A. Shaburov, Candidate’s Dissertation in Physics and Mathematics (Leningrad, 1975).

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