Basic analysis of reflectometry data software package for the analysis of multilayered structures according to reflectometry data-Reference-Cited by-同舟云学术

Basic analysis of reflectometry data software package for the analysis of multilayered structures according to reflectometry data

Published:2012-01 Issue:1 Volume:57 Page:134-143
ISSN:1063-7745
Container-title:Crystallography Reports
language:en
Short-container-title:Crystallogr. Rep.

Author:

Astaf’ev S. B.,Shchedrin B. M.,Yanusova L. G.

Publisher

Pleiades Publishing Ltd

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1063774511040031.pdf

Reference20 articles.

1. R. W. James, Optical Principles of the Diffraction of X-Rays (Cornell Univ., Ithaca, New York, 1965).

2. Analysis Programs for Reflectivity Data at the Institut Laue—Langevin; http://www.ill.eu/html/instruments-support/computing-for-science/cs-software/all-software/ref-analysis/ .

3. Sofware for Neutron Reflection Data Analysis; http://material.fysik.uu.se/Group-members/adrian/reflect.htm .

4. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).

5. X-Ray and Neutron Reflectivity, Ed. by J. Daillant and A. Gibaud (Springer, 2009).

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