Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases-Reference-Cited by-同舟云学术

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Use of time-of-flight mass spectrometry for monitoring helium microcontamination in the industrial manufacture of extra high purity inert gases

Published:2010-12 Issue:14 Volume:65 Page:1532-1536
ISSN:1061-9348
Container-title:Journal of Analytical Chemistry
language:en
Short-container-title:J Anal Chem

Author:

Zhdan V. T.,Kozlovskii A. V.,Mozhaev A. N.,Pilyugin I. I.

Publisher

Pleiades Publishing Ltd

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1134/S1061934810140145.pdf

Reference11 articles.

1. Bondarenko, V.L., Chekh, Yu.A., and Rura, V.N., Tekhnich. Gazy, 2005, no. 1, p. 46.

2. Cook, K.D., Bennett, K.H., and Haddix, M.L., Ind. Eng. Chem. Res., 1999, vol. 38, p. 1192.

3. Hoffmann, T., Real-Time Mass Spectrometry, Anal. Bioanal. Chem., 2003, vol. 375, p. 36.

4. Reinhardt, B., Cordonnier, A., and Florent, P., Powder Technol., 1999, vol. 101, no. 1, p. 81.

5. Kozlovskii, A.V., RF Patent 2103763, 1998, http://www.fips.ru/wps/wcm/connect/connect-ru/ru/informresources/inform-retrieval-system/ .

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