Characterization of Functional Nanofilms on InP by Ultrasoft X-ray Emission and Infrared Spectroscopies
Author:
Publisher
Pleiades Publishing Ltd
Subject
Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering
Link
https://link.springer.com/content/pdf/10.1134/S0020168521120116.pdf
Reference29 articles.
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3. Wasley, N.A., Nano-Photonics in III–V Semiconductors for Integrated Quantum Optical Circuits, Cham: Springer, 2014.https://doi.org/10.1007/978-3-319-01514-9
4. Rudan, M., Physics of Semiconductor Devices, Cham: Springer, 2014. https://doi.org/10.1007/978-1-4939-1151-6
5. Chen, J., Lv, J., and Wang, Q., Electronic properties of Al/MoO3/p-InP enhanced Schottky barrier contacts, Thin Solid Films, 2016, vol. 616, pp. 145–150.https://doi.org/10.1016/j.tsf.2016.08.019
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