Ba0.8Sr0.2TiO3 ferroelectric nanofilms on silicon buffered with a TiO2 layer
Author:
Publisher
Pleiades Publishing Ltd
Subject
Materials Chemistry,Metals and Alloys,Inorganic Chemistry,General Chemical Engineering
Link
http://link.springer.com/content/pdf/10.1134/S0020168512060192.pdf
Reference11 articles.
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2. Sigov, A.S., Mishina, E.D., and Mukhortov, V.M., Thin Ferroelectric Films: Preparation and Prospects of Integration, Phys. Solid State, 2010, vol. 52, no. 4, pp. 762–770.
3. Wen-Ching Shih, Yuan-Sung Liang, and Mu-Shiang, W.U., Jpn. J. Appl. Phys., 2008, no. 47, pp. 7475–7479.
4. Li, H., Roytburd, A.L., Alpay, S.P., Tran, T.D., et al., Dependence of Dielectric Properties on Internal Stresses in Epitaxial Barium Strontium Titanate Thin Films, Appl. Phys. Lett., 2001, vol. 78, pp. 2354–2359.
5. Park, W.Y. and Hwang, C.S., Film-Thickness-Dependent Curie-Weiss Behavior of (Ba,Sr)TiO3 Thin-Film Capacitors Having Pt Electrodes, Appl. Phys. Lett., 2004, vol. 85, no. 22, pp. 5313–5315.
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