1. Shindo, D., Analytical Electron Microscopy for Materials Science: Monograph, Tokyo: Springer, 1998.
2. Goldstein, J., Newbury, D., Joy, D., Lyman, C., Echlin, P., Lifshin, E., Sawyer, L., and Michael, J., Scanning Electron Microscopy and Electron Probe Microanalysis, New York: Kluwer Academic, Plenum, 2003.
3. Bushnev, L.S., Kolobov, Yu.R., and Myshlyaev, M.M., Osnovy elektronnoi mikroskopii: Uchebnoe posobie (Principles of Electron Microscopy: The School-Book), Tomsk: Tomsk. Univ., 1990.
4. Williams, D.B. and Carter, B.C., Transmission Electron Microscopy: A Textbook for Materials Science, New York: Springer, 2009, 2nd ed.
5. Kolobov, Yu.R., Valiev, R.Z., Grabovetskaya, G.P., et al., Grain Boundary Diffusion and Properties of Nanostructured Materials, Cambridge: International Science Publishing, 2007.