Structural characterization of GaN epilayers on silicon: Effect of buffer layers-Reference-Cited by-同舟云学术

Structural characterization of GaN epilayers on silicon: Effect of buffer layers

Published:2011-04 Issue:4 Volume:37 Page:326-329
ISSN:1063-7850
Container-title:Technical Physics Letters
language:en
Short-container-title:Tech. Phys. Lett.

Author:

Sorokin L. M.,Kalmykov A. E.,Bessolov V. N.,Feoktistov N. A.,Osipov A. V.,Kukushkin S. A.,Veselov N. V.

Publisher

Pleiades Publishing Ltd

Subject

Physics and Astronomy (miscellaneous)

Link

http://link.springer.com/content/pdf/10.1134/S1063785011040158.pdf

Reference14 articles.

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